DENSsolutions
FireBolt
In-situ SEM Heating & Biasing
Heating and electrical biasing in SEM / FIB.
TEM 용 Nano-Chips 적용 가능.
U-NANOTEC / ELECTRON MICROSCOPY
Advanced Electron
Microscopy
Solutions.
Solutions for SEM / TEM / FIB
01 / 03
In-situ SEM/TEM solutionNano Probing/Sample ManpulatingHybrid Pixelated Detector4D-SPEDSub-sampling & Inpainting Image
Our Solutions
In-situ TEM / SEM
Heating · Biasing · Gas · Liquid
SEM / TEM in-situ experiments
Nano-Probing
Sample manipulation · Nano-Probing
EBIC · EBAC · RCI · EBIRCH · EBIV
4D-SPED Analysis
Orientation · Phase · Strain
E-field · ePDF mapping
Hybrid Pixelated Detector
4D-STEM · Ptychography
Time-resolved TEM · Diffraction
Plasma Cleaning
Chamber · Sample · Polepiece
SEM / TEM / FIB plasma cleaning
Sub-sampling & Inpainting
Sparse acquisition · Reconstruction
Low dose · Less data · Faster acquisition
PRODUCTS & UPDATES
Featured Products
DENSsolutions
HydroBolt
In-situ SEM Electrochemistry
SEM용 액상 전기화학실험 Stage experiments.
3전극 시스템 구성
DENSsolutions
Infinity Light
Light for Climate & Stream Infinity
Gas 혹은 Liquid 조건에서 광조사&온도&전압인가.
DENSsolutions / SOFTWARE
Nexus
In-situ Data Integration & Visualization
Align images, spectra and experimental conditions on a shared timeline.
Synchronize data, analyze in Python and export results within one project.
XEI Scientific
TEM Wand
TEM Chamber Plasma Cleaning
Side-entry plasma cleaning at the TEM polepiece.
Oxygen radicals remove hydrocarbon contamination.
OUR TECHNOLOGY PARTNERS
NEWS & INSIGHTS
제품 소식
PRODUCT / DENSSOLUTIONS · 2026.09.20FireBolt & HydroBolt
Nexus
Evactron TEM Wand
FireBolt & HydroBolt
In-situ SEM Solutions
Heating·Biasing·ElectroChemistry in SEM ↗
SOFTWARE / DENSSOLUTIONS · 2026.09.20Nexus
Data Integration & Analysis
이미지 및 동영상과 실험 Raw data를 활용한 후처리 솔루션 ↗
PRODUCT / XEI SCIENTIFIC · 2026.09.20Evactron TEM Wand
TEM Specimen Chamber Plasma Cleaning
TEM 챔버내의 Hydrocarbon 제거 ↗
CONTACT U-NANOTEC
기술 및 제품 문의
기술·견적 문의 ↗sales@u-nanotec.com
031-786-6650
031-786-6650